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ECSE 649 VLSI Testing (4 unit茅s)

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Nota : Ceci est la version 2017鈥�2018 de l'annuaire 茅lectronique. Veuillez mettre 脿 jour l'ann茅e dans la barre d'adresse de votre navigateur pour une version plus r茅cente de cette page, ou .

Offered by: G茅nie 茅lectr. et informatique (G茅nie et l'architecture)

Administered by: 脡tudes sup茅rieures et recherch

Vue d'ensemble

G茅nie 茅lectrique : The course is to orient designers of VLSI chips and boards to think about testing problems in parallel with the design process. Consideration in structured design-for-testability as a requirement for complex systems will be emphasized; as well as the emerging concept of built-in self-test (BIST).

Terms: This course is not scheduled for the 2017-2018 academic year.

Instructors: There are no professors associated with this course for the 2017-2018 academic year.

  • (3-0-9)

  • Prerequisite: B.Eng. or equivalent.

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